• DocumentCode
    2349554
  • Title

    Optimization of Assertion Placement in Time-Constrained Embedded Systems

  • Author

    Izosimov, Viacheslav ; Lora, Michele ; Pravadelli, Graziano ; Fummi, Franco ; Peng, Zebo ; Guglielmo, Giuseppe Di ; Fujita, Masahiro

  • fYear
    2011
  • fDate
    23-27 May 2011
  • Firstpage
    171
  • Lastpage
    176
  • Abstract
    We present an approach for optimization of assertion placement in time-constrained HW/SW modules for detection of errors due to transient and intermittent faults. During the design phases, these assertions have to be inserted into the executable code and, hence, will always be executed with the corresponding code branches. As the result, they can significantly increase execution time of a module, in particular, contributing to a much longer execution of the worst case, and cause deadline misses. Assertions have different characteristics such as tightness (or "local error coverage") and execution latency. Taking into account these properties can increase efficiency of assertion checks in time-constrained embedded HW/SW modules. We have developed a design optimization framework, which (1) identifies candidate locations for assertions, (2) associates a candidate assertion to each location, and (3) selects a set of assertions in terms of performance degradation and assertion tightness. Experimental results have shown the efficiency of the proposed techniques.
  • Keywords
    embedded systems; error detection; program debugging; assertion placement; candidate assertion; candidate locations; executable code; execution latency; time-constrained embedded systems; Algorithm design and analysis; Circuit faults; Degradation; Embedded systems; Optimization; Synthetic aperture sonar; Transient analysis; executable assertions; soft errors; time-constrained embedded systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2011 16th IEEE European
  • Conference_Location
    Trondheim
  • ISSN
    1530-1877
  • Print_ISBN
    978-1-4577-0483-3
  • Electronic_ISBN
    1530-1877
  • Type

    conf

  • DOI
    10.1109/ETS.2011.35
  • Filename
    5957942