• DocumentCode
    234980
  • Title

    Package embedded decoupling capacitor impact on core power delivery network for ARM SoC application

  • Author

    GaWon Kim ; Min, Moonsik ; Yang, May ; Gundurao, Anil ; You, Eileen ; Gill, Harjot ; Seungyong Cha ; Younghoon Kim ; Se-ho You ; Seungbae Lee ; Woonghwan Ryu

  • Author_Institution
    Syst. LSI SoC Bay Area R&D (SBR), Samsung Semicond. Inc., San Jose, CA, USA
  • fYear
    2014
  • fDate
    27-30 May 2014
  • Firstpage
    354
  • Lastpage
    359
  • Abstract
    In this paper, a BGA package having a ARM SoC chip is introduced, which has component-type embedded decoupling capacitors (decaps) for good power integrity performance of core power. To evaluate and confirm the impact of embedded decap on core PDN (power distribution network), two different packages were manufactured with and without the embedded decaps. The self impedances of system-level core PDN were simulated in frequency-domain and On-chip DvD (Dynamic Voltage Drop) simulations were performed in time-domain in order to verify the system-level impact of package embedded decap. There was clear improvement of system-level core PDN performance in middle frequency range when package embedded decaps were employed. In conclusion, the overall system-level core PDN for ARM SoC could meet the target impedance in frequency-domain as well as the target On-chip DvD level by having package embedded decaps.
  • Keywords
    ball grid arrays; system-on-chip; ARM SoC application; BGA package; core power delivery network; dynamic voltage drop; package embedded decaps; package embedded decoupling capacitor; power distribution network; system level impact; DVD; Frequency-domain analysis; Impedance; Noise; Simulation; Substrates; System-on-chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/ECTC.2014.6897311
  • Filename
    6897311