• DocumentCode
    2349999
  • Title

    Characterization of the RFID deterministic path loss in manufacturing environments

  • Author

    Goes, A.A. ; Cardieri, Paulo ; Yacoub, Michel Daoud

  • Author_Institution
    Commun. Eng. Dept., State Campinas Univ., Campinas, Brazil
  • fYear
    2012
  • fDate
    9-12 Sept. 2012
  • Firstpage
    647
  • Lastpage
    652
  • Abstract
    Results of measurement campaigns carried out aiming at the development of a tool for design, deployment, and analysis of RFID systems are shown. Particularly, in this paper, the radio path loss from an RFID reader towards the test tag and back to the reader is characterized at the 915 MHz band. The path loss is estimated based on the received signal strength measured at the reader, for different reader-tag separation distances and different antenna tag heights. Several propagation scenarios have been considered, including outdoor and indoor environments for which an extensive number of typical real manufacturing plants have been chosen. The field data are then compared to a proposed novel, improved version of the classical 2-ray path loss model, adjusted to also include the non-omnidirectional antenna radiation patterns at the reader and tag sides. To the best of the authors´ knowledge, the scope and reach of the measurements as well as the proposed path loss model are new.
  • Keywords
    antenna radiation patterns; indoor radio; radiofrequency identification; 2-ray path loss; RFID deterministic path loss; RFID reader; antenna tag heights; bandwidth 915 MHz; indoor environments; manufacturing environments; manufacturing plants; nonomnidirectional antenna radiation patterns; outdoor environments; radio path loss; reader-tag separation distances; received signal strength; Antenna measurements; Antenna radiation patterns; Buildings; Loss measurement; Radiofrequency identification; Propagation Model; RFID; backscattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Personal Indoor and Mobile Radio Communications (PIMRC), 2012 IEEE 23rd International Symposium on
  • Conference_Location
    Sydney, NSW
  • ISSN
    2166-9570
  • Print_ISBN
    978-1-4673-2566-0
  • Electronic_ISBN
    2166-9570
  • Type

    conf

  • DOI
    10.1109/PIMRC.2012.6362864
  • Filename
    6362864