DocumentCode :
2350186
Title :
Extraction of a large set of laser parameters from different measurements
Author :
Morthier, G. ; Verhoeve, P. ; Baets, R. ; Schatz, R.
Author_Institution :
Dept. of Inf. Technol., Gent Univ., Belgium
fYear :
1996
fDate :
13-18 Oct. 1996
Firstpage :
175
Lastpage :
176
Abstract :
We show how most of the parameters of a DFB laser can be extracted from a limited number of relatively simple measurements. These measurements include the ASE spectra at different currents below threshold, the RIN spectra above threshold and the P-I relation. We have performed curve-fitting on different characteristics such as the ASE spectrum, the RIN spectrum and the P-I curve. From the ASE spectrum measured in the vicinity of the lasing wavelength we can extract grating parameters, facet phases, refractive index and gain as well as the wavelength and current dependence of the last two parameters.
Keywords :
distributed feedback lasers; optical testing; refractive index measurement; semiconductor device testing; semiconductor lasers; superradiance; ASE spectra; DFB laser parameter extraction; P-I relation; RIN spectra; RIN spectrum; below threshold; current dependence; facet phases; grating parameters; laser parameters; lasing wavelength; refractive index; relatively simple measurements; wavelength dependence; Charge carrier lifetime; Cost function; Current measurement; Data mining; Laser modes; Masers; Parameter extraction; Reflectivity; Refractive index; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Laser Conference, 1996., 15th IEEE International
Conference_Location :
Haifa, Israel
Print_ISBN :
0-7803-3163-X
Type :
conf
DOI :
10.1109/ISLC.1996.558796
Filename :
558796
Link To Document :
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