• DocumentCode
    235103
  • Title

    Embedded system based on microcontroller for generating I-V curves of electronic devices

  • Author

    Illera, Mario J. ; Sepulveda, Sergio B.

  • Author_Institution
    Dept. of Electr. & Electron., Francisco de Paula Santander Univ., Cucuta, Colombia
  • fYear
    2014
  • fDate
    5-7 Dec. 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    A key parameter in the analysis of electronic devices behavior is their current-voltage curve, also known as characteristic curve. This information allows the designer to select the type of components required for a given application in order to obtain an optimal system performance. This paper presents a low-cost and low-power consumption embedded system able to accurately generate the characteristic curve of electronic devices. Microcontroller PIC18F4550 effectively handles different serial communication protocols to exchange data between a Java application running on a computer and different peripheral devices. The firmware within the microcontroller receives data from the Java interface and executes an algorithm to send a series of analog voltages to the element being characterized and it also measures the resultant current for each voltage; then, the pair of data points is sent back to the Java application to build the plot. The resultant data can be exported to a spreadsheet to be further analyzed. We characterized different electronic devices to evaluate the performance of the prototype. Successful repeatability tests and validation of theoretical models with experimental data indicated that the embedded system developed is accurate and reliable.
  • Keywords
    Java; electron device testing; embedded systems; low-power electronics; microcontrollers; power aware computing; protocols; I-V curves; Java application; Java interface; current-voltage curve; electronic device behavior analysis; firmware; low-cost low-power consumption embedded system; microcontroller PIC18F4550; optimal system performance; peripheral devices; serial communication protocols; Current measurement; Data models; Embedded systems; Java; Microcontrollers; Resistors; Voltage measurement; Embedded system; Java; Microcontroller; Serial communication protocols;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Performance Computing and Communications Conference (IPCCC), 2014 IEEE International
  • Conference_Location
    Austin, TX
  • Type

    conf

  • DOI
    10.1109/PCCC.2014.7017033
  • Filename
    7017033