Title :
Rich-IDM: Transforming the user experience of legacy applications
Author :
Paiano, Roberto ; Pandurino, Andrea ; Mainetti, Luca
Author_Institution :
Dept. of Innovation Eng., Univ. of Salento, Lecce, Italy
Abstract :
Rich Internet Applications (RIAs) can be used as a way to modernize Legacy Applications (LAs), in particular to provide users with an innovative, state-of-the-art interactive experience. RIAs have the same richness in term of interaction grammar as Client-Server Applications (CSAs) and Desktop Applications (DAs), giving designers the opportunity to exploit the Web infrastructure also in domains where the communication between the user and the application is more complex of a sequence of page requests. In the transition from LAs to RIAs, however, several challenges need to be faced, including fundamental issues affecting user requirements and usability. In this paper we present the preliminary results of a large-scale industrial project, which focused on migrating a complex LA (VB6 + Cobol) to a RIA (JSF + SOA). In this context, we introduce a novel method (Rich-IDM) to transform the design of the User Experience (UX) and the strategy for interactive communication from LAs to RIAs in a graceful and disciplined manner, thus preventing the many flaws that typically are manifested in similar projects. We also show how Rich-IDM originally extends and well integrates into other well-known conceptual tools - the Conallen´s UX model and the RUX model - within the OMG´s ADM framework.
Keywords :
Internet; interactive systems; software maintenance; CSA; Cobol; JSF; RIA; Rich Internet Application; SOA; VB6; Web infrastructure; client-server application; desktop application; interaction grammar; interactive communication; legacy application; rich-IDM; Context; Internet; Navigation; Object oriented modeling; Semantics; Unified modeling language; Web sites; Dialogue Modeling; Rich Internet Application; UX Requirements; UX Transformation; User Experience;
Conference_Titel :
Web Systems Evolution (WSE), 2011 13th IEEE International Symposium on
Conference_Location :
Williamsburg, VI
Print_ISBN :
978-1-4577-0699-8
DOI :
10.1109/WSE.2011.6081823