DocumentCode :
2352531
Title :
Packaging requirements and solutions for CMOS imaging sensors
Author :
Sengupta, K. ; Sundahl, R. ; Kawashima, S. ; Arellano, R. ; Sklenicka, C. ; Thompson, D.
Author_Institution :
Intel Corp., Chandler, AZ, USA
fYear :
1998
fDate :
19-21 Oct 1998
Firstpage :
194
Lastpage :
198
Abstract :
Image sensors place additional demands on packaging technology, beyond those for conventional ICs, including (1) an optical quality window, (2) precision mechanical die alignment, and (3) protection of die imaging attributes from environmental and manufacturing effects. In our development of CMOS sensors, we chose a commercially available package, the windowed QFP, as the basis for the CMOS sensor package. A pre-molded epoxy cavity package provides moisture protection similar to that for ceramic packages. Control of the tip and tilt components of die/package alignment and the tolerance stack-up between die and lens enables simple lens system alignment. The ceramic/glass lid maintains moisture protection while providing superior thermomechanical performance. This packaging technology gives customers a major advantage in board assembly with a mass reflow capable package that is unique in the industry
Keywords :
CMOS image sensors; assembling; environmental degradation; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; moulding; plastic packaging; reflow soldering; CCD devices; CMOS image sensor; CMOS imaging sensors; CMOS sensor package; CMOS sensors; CMOS-based technology; board assembly; camera system function integration; ceramic packages; ceramic/glass lid; die imaging attributes; die imaging protection; die/lens tolerance stack-up; die/package alignment; digital imaging; environmental effects; image sensors; lens system alignment; manufacturing effects; market segment; mass reflow capable package; mechanical die alignment; moisture protection; optical quality window; packaging; packaging technology; pre-molded epoxy cavity package; product cost; product goals; product performance; thermomechanical performance; volume sensor manufacture; windowed QFP; CMOS image sensors; Ceramics; Image sensors; Lenses; Mechanical sensors; Moisture; Optical imaging; Packaging; Protection; Sensor phenomena and characterization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1998. Twenty-Third IEEE/CPMT
Conference_Location :
Austin, TX
ISSN :
1089-8190
Print_ISBN :
0-7803-4523-1
Type :
conf
DOI :
10.1109/IEMT.1998.731075
Filename :
731075
Link To Document :
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