DocumentCode :
2352626
Title :
On per-test fault diagnosis using the X-fault model
Author :
Wen, Xiaoqing ; Miyoshi, Tokiharu ; Kajihara, Seiji ; Wang, Laung-Temg L T ; Saluja, Kewal K. ; Kinoshita, Kozo
Author_Institution :
Dept. of Comput. Sci. & Eng., Kyushu Inst. of Technol., Iizuka, Japan
fYear :
2004
fDate :
7-11 Nov. 2004
Firstpage :
633
Lastpage :
640
Abstract :
This work proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model represents all possible behaviors of a physical defect or defects in a gate and/or on its fanout branches by using different X symbols on the fanout branches. A novel technique is proposed for analyzing the relation between observed and simulated responses to extract diagnostic information and to score the results of diagnosis. Experimental results show the effectiveness of our method.
Keywords :
fault simulation; integrated circuit testing; logic testing; X-fault model; diagnostic information; fanout branches; per-test fault diagnosis; Analytical models; Circuit faults; Circuit simulation; Data mining; Failure analysis; Fault diagnosis; Informatics; Information analysis; Logic; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Aided Design, 2004. ICCAD-2004. IEEE/ACM International Conference on
ISSN :
1092-3152
Print_ISBN :
0-7803-8702-3
Type :
conf
DOI :
10.1109/ICCAD.2004.1382653
Filename :
1382653
Link To Document :
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