DocumentCode
235267
Title
A novel method to predict fluid/structure interaction in IC packaging
Author
Chih-Chung Hsu ; Tzu-Chang Wang ; Yen-Chi Chen ; Yang-Kai Lin
Author_Institution
Dept. of Chem. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
fYear
2014
fDate
27-30 May 2014
Firstpage
1258
Lastpage
1263
Abstract
This paper reports a perspective investigation of computational modeling of fluid-structure interaction (FSI) in molded integrated-circuit(IC) packaging. The investigation is carried out through two aspects, respectively on interaction between the fluid and structure in the encapsulation process and appropriate methodology for modeling. We present a novel and integrated method to predict the FSI during the encapsulation process. This method not only provides more accurate melt front and pressure result but also predict precisely the FSI behavior through the dynamic mesh deformation technique simultaneously in accordance with continually deformed geometry (two way FSI). This is different from previous study that only one way considered fixed geometry (one way FSI) during encapsulation. Moreover, the experimental data for single- and stacked-chip were compared with the simulation results for two way FSI implementation to verify flow front advancement. From a real paddle shift case study, the result indicates that the deflection prediction is well predicted and could predict void formation well when it considers two way FSI effect. It is expected that this paper could clarify relevant issues in prediction of FSI in IC packaging and induce more considerations for modeling FSI using two way FSI multiphase flow method.
Keywords
encapsulation; integrated circuit packaging; multiphase flow; FSI multiphase flow method; IC packaging; computational modeling; deflection prediction; encapsulation process; fluid structure interaction; molded integrated circuit packaging; Cavity resonators; Encapsulation; Filling; Fluids; Solid modeling; Solids; Strain;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location
Orlando, FL
Type
conf
DOI
10.1109/ECTC.2014.6897453
Filename
6897453
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