• DocumentCode
    235267
  • Title

    A novel method to predict fluid/structure interaction in IC packaging

  • Author

    Chih-Chung Hsu ; Tzu-Chang Wang ; Yen-Chi Chen ; Yang-Kai Lin

  • Author_Institution
    Dept. of Chem. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • fYear
    2014
  • fDate
    27-30 May 2014
  • Firstpage
    1258
  • Lastpage
    1263
  • Abstract
    This paper reports a perspective investigation of computational modeling of fluid-structure interaction (FSI) in molded integrated-circuit(IC) packaging. The investigation is carried out through two aspects, respectively on interaction between the fluid and structure in the encapsulation process and appropriate methodology for modeling. We present a novel and integrated method to predict the FSI during the encapsulation process. This method not only provides more accurate melt front and pressure result but also predict precisely the FSI behavior through the dynamic mesh deformation technique simultaneously in accordance with continually deformed geometry (two way FSI). This is different from previous study that only one way considered fixed geometry (one way FSI) during encapsulation. Moreover, the experimental data for single- and stacked-chip were compared with the simulation results for two way FSI implementation to verify flow front advancement. From a real paddle shift case study, the result indicates that the deflection prediction is well predicted and could predict void formation well when it considers two way FSI effect. It is expected that this paper could clarify relevant issues in prediction of FSI in IC packaging and induce more considerations for modeling FSI using two way FSI multiphase flow method.
  • Keywords
    encapsulation; integrated circuit packaging; multiphase flow; FSI multiphase flow method; IC packaging; computational modeling; deflection prediction; encapsulation process; fluid structure interaction; molded integrated circuit packaging; Cavity resonators; Encapsulation; Filling; Fluids; Solid modeling; Solids; Strain;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
  • Conference_Location
    Orlando, FL
  • Type

    conf

  • DOI
    10.1109/ECTC.2014.6897453
  • Filename
    6897453