• DocumentCode
    2353625
  • Title

    Efficiency of film capacitors in forced electrothermal modes

  • Author

    Emelyanov, Oleg A.

  • Author_Institution
    St. Petersburg State Polytech. Univ.
  • fYear
    2006
  • fDate
    11-14 June 2006
  • Firstpage
    326
  • Lastpage
    327
  • Abstract
    The efficiency of film capacitors in forced electrothermal modes is investigated. The lifetime in the range of 50-350 seconds is caused by the electrothermal breakdown. The reactive power values of 500-650 MVA/m3 are achieved. The lifetime prediction model´s data is compared to the results of the experiment. The criterion for the optimum choice of a capacitor in the investigated modes is offered
  • Keywords
    electron device testing; power capacitors; reactive power; film capacitor testing; forced electrothermal breakdown; lifetime prediction model; reactive power; Capacitance; Capacitors; Electric breakdown; Electrothermal effects; Heat transfer; Metallization; Predictive models; Temperature dependence; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 2006. Conference Record of the 2006 IEEE International Symposium on
  • Conference_Location
    Toronto, Ont.
  • ISSN
    1089-084X
  • Print_ISBN
    1-4244-0333-2
  • Type

    conf

  • DOI
    10.1109/ELINSL.2006.1665323
  • Filename
    1665323
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2353625