DocumentCode
2353652
Title
Thermal sensitivity analysis for the 119 PBGA-a framework for rapid prototyping
Author
Mulgaonker, Shailesh ; Berg, Howard M.
Author_Institution
Adv. Packaging Dev. Center, Motorola Inc., Tempe, AZ, USA
fYear
1995
fDate
21-24 May 1995
Firstpage
28
Lastpage
37
Abstract
New package prototyping is often a sequential process where the chip and system parameters are specified first, then the package design is initiated. A reduction in overall cycle time can be affected if the events occur simultaneously. This study proposes a methodology for addressing this issue. The method is outlined in the context of prototyping the 119 plastic ball grid array (PBGA) package thermal performance. The parameters influencing performance are system, device or package based. Ranges for the “yet-to-be-fixed” parameters are determined and factorial analyses used to yield approximate linear models with interactions for package performance. Once the device and system parameters are “fixed”, the linear equations are solved simultaneously with junction and board temperature constraints to yield a design options map for package layout
Keywords
integrated circuit packaging; plastic packaging; sensitivity analysis; thermal analysis; 119 PBGA; approximate linear models; board temperature constraints; design options map; factorial analyses; junction temperature constraints; linear equations; overall cycle time; package layout; package performance; plastic ball grid array; rapid prototyping; thermal performance; thermal sensitivity analysis; Costs; Electronics packaging; Lead; Plastic packaging; Prototypes; Semiconductor device packaging; Sensitivity analysis; Substrates; Temperature; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location
Las Vegas, NV
Print_ISBN
0-7803-2736-5
Type
conf
DOI
10.1109/ECTC.1995.514357
Filename
514357
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