DocumentCode :
235454
Title :
Effect of variation in the reflow profile on the microstructure of near eutectic SnAgCu alloys
Author :
Mutuku, Francis ; Arfaei, Babak ; Cotts, Eric J.
Author_Institution :
Phys. Dept. & Mater. Sci. Program, Binghamton Univ., Binghamton, NY, USA
fYear :
2014
fDate :
27-30 May 2014
Firstpage :
1769
Lastpage :
1775
Abstract :
The effects of changes in thermal history (changes in the reflow profile) on solder joint microstructure are examined. The effects of variations in the reflow temperature, and in the cooling rate from the melt, on the microstructure of near eutectic lead free SnAgCu solder joints were investigated. Changes in precipitate or Sn grain morphologies have previously been correlated with changes in the failure rates in these Pb free alloys. Thus correlations were sought between changes in reflow parameters and in both precipitate and Sn grain morphologies. Precise reflows were conducted in a differential scanning calorimeter and it was found that changes in microstructure were correlated with large changes in the reflow temperature, and that the precipitate microstructure was a strong function of the cooling rate. This effect was similar in magnitude to that observed in relatively large changes (1 to 3wt%) in the Ag concentration of these near eutectic SnAgCu alloys.
Keywords :
cooling; copper alloys; differential scanning calorimetry; eutectic alloys; lead; reflow soldering; silver alloys; solders; tin alloys; Pb; SnAgCu; cooling rate; differential scanning calorimeter; eutectic alloys; eutectic lead free solder joints; precipitate microstructure; reflow profile; reflow temperature; solder joint microstructure; thermal history; Cooling; Microstructure; Morphology; Optical imaging; Optical polarization; Soldering; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2014 IEEE 64th
Conference_Location :
Orlando, FL
Type :
conf
DOI :
10.1109/ECTC.2014.6897538
Filename :
6897538
Link To Document :
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