DocumentCode
235772
Title
Fault isolation by conquering obstruction effect of resistor in complex cases analysis
Author
Gaojie Wen
Author_Institution
Freescale Semicond. (China) Ltd., Tianjin, China
fYear
2014
fDate
June 30 2014-July 4 2014
Firstpage
191
Lastpage
194
Abstract
Resistor plays a key role in circuit designer´s view as it was indispensable for the whole circuit function. But for integrated circuit failure analysis, the effect of resistor contained both guidance and as well as blocks to find the root cause. The obstruction effect of resistor was seldom studied in failure analysis. This paper presented how resistor to be block for failure analysis. And how to conquer the obstruction effect was also studied which will be helpful in analyzing complicated failure cases.
Keywords
failure analysis; fault diagnosis; integrated circuit reliability; resistors; complex cases analysis; fault isolation; integrated circuit failure analysis; obstruction effect; resistor; Failure analysis; Junctions; Metals; Resistance; Resistors; Temperature sensors; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium on the
Conference_Location
Marina Bay Sands
ISSN
1946-1542
Print_ISBN
978-1-4799-3931-2
Type
conf
DOI
10.1109/IPFA.2014.6898127
Filename
6898127
Link To Document