• DocumentCode
    235772
  • Title

    Fault isolation by conquering obstruction effect of resistor in complex cases analysis

  • Author

    Gaojie Wen

  • Author_Institution
    Freescale Semicond. (China) Ltd., Tianjin, China
  • fYear
    2014
  • fDate
    June 30 2014-July 4 2014
  • Firstpage
    191
  • Lastpage
    194
  • Abstract
    Resistor plays a key role in circuit designer´s view as it was indispensable for the whole circuit function. But for integrated circuit failure analysis, the effect of resistor contained both guidance and as well as blocks to find the root cause. The obstruction effect of resistor was seldom studied in failure analysis. This paper presented how resistor to be block for failure analysis. And how to conquer the obstruction effect was also studied which will be helpful in analyzing complicated failure cases.
  • Keywords
    failure analysis; fault diagnosis; integrated circuit reliability; resistors; complex cases analysis; fault isolation; integrated circuit failure analysis; obstruction effect; resistor; Failure analysis; Junctions; Metals; Resistance; Resistors; Temperature sensors; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium on the
  • Conference_Location
    Marina Bay Sands
  • ISSN
    1946-1542
  • Print_ISBN
    978-1-4799-3931-2
  • Type

    conf

  • DOI
    10.1109/IPFA.2014.6898127
  • Filename
    6898127