DocumentCode
2357776
Title
Interaction of multiple delaminations in a PQFP
Author
Ho, Siow Ling ; Yu, Jiyin ; Tay, Andrew A O
Author_Institution
Dept. of Mech. Eng., Nat. Univ. of Singapore, Singapore, Singapore
fYear
2010
fDate
8-10 Dec. 2010
Firstpage
206
Lastpage
210
Abstract
To lend more confidence to the engineers adopting the fracture mechanics approach in the study of delamination in IC packages, a series of studies is performed to investigate the interactions of multiple delaminations and the impact of the die edge. Finite element models are constructed and the energy release rate (ERR) of the crack tips calculated using the virtual crack closure method and J-integral. Since the fracture toughness of the interface is dependent on the mode mixity, the mode mixity of the crack tips will be calculated using a method based on the modified virtual crack closure method. The vehicle of study is a plastic quad flat pack (PQFP) and the interface of interest is the pad/encapsulant interface. The interaction of up to 3 delaminations is studied. It is found that for a single long edge delamination, the ERR will peak in the vicinity of the die. As for delamination of identical sizes at different locations, the edge delamination will result in the highest ERR. Hence, in the choice of delaminations to be included in the multiple delamination analyses, the edge delamination is always included (named crack#1) and the other delaminations (crack#2 and crack#3) lie in the vicinity of the die edge. In addition to multiple delaminations of equal length, the interaction among delaminations of unequal length is studied to investigate the shielding or amplification effect. It is found that amplification effect is observed for all the combinations of delamination studied. Both the delamination length and the distance between the crack tips play a part in the influence of the amplification effect.
Keywords
delamination; finite element analysis; integrated circuit packaging; ERR; IC package; J-integral; PQFP; edge delamination; energy release rate; finite element models; multiple delamination interaction; pad-encapsulant interface; plastic quad flat pack; virtual crack closure method;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Packaging Technology Conference (EPTC), 2010 12th
Conference_Location
Singapore
Print_ISBN
978-1-4244-8560-4
Electronic_ISBN
978-1-4244-8561-1
Type
conf
DOI
10.1109/EPTC.2010.5702633
Filename
5702633
Link To Document