DocumentCode :
2357955
Title :
P3O-3 Wideband Layer Mode Acoustic Devices on GaN/Sapphire Substrate
Author :
Hohkawa, K. ; Yokota, M. ; Koh, K. ; Nishimura, K. ; Shigekawa, N.
Author_Institution :
Fac. of Eng., Kanagawa Inst. of Eng.
fYear :
2006
fDate :
2-6 Oct. 2006
Firstpage :
2301
Lastpage :
2304
Abstract :
There exists SEZAWA mode on thin film GaN on Sapphire substrates. When the film thickness of GaN is selected at the condition thick enough to generate dual modes, the device has an interesting frequency response that the dispersion characteristics has the reverse polarity against that of the ordinal single mode of SEZAWA wave. In addition the bandwidth increases more than 1 order to that of the ordinal device with the single mode. This paper discusses the origin of these characteristics based on the experimental result and considers requirement for practical use
Keywords :
frequency response; gallium compounds; sapphire; surface acoustic wave devices; surface acoustic waves; thin films; GaN; SEZAWA mode; dispersion characteristics; gallium nitride; reverse polarity; sapphire substrate; thin film; wideband layer mode acoustic devices; Acoustic devices; Frequency response; Gallium nitride; Insertion loss; Propagation delay; Propagation losses; Substrates; Surface acoustic waves; Transducers; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 2006. IEEE
Conference_Location :
Vancouver, BC
ISSN :
1051-0117
Print_ISBN :
1-4244-0201-8
Electronic_ISBN :
1051-0117
Type :
conf
DOI :
10.1109/ULTSYM.2006.579
Filename :
4152435
Link To Document :
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