DocumentCode
235820
Title
An innovative method to overcome signal instability during TDR measurement of power MOSFET
Author
Tan, S.Y. ; Ng, Kang Kee ; Gan, S.Y. ; Sin, C.K.
Author_Institution
Infineon Technol. (Malaysia) Sdn. Bhd., Batu Berendam, Malaysia
fYear
2014
fDate
June 30 2014-July 4 2014
Firstpage
150
Lastpage
155
Abstract
Hand probing is the most common technique being applied in Time Domain Reflectometry (TDR) measurement. It is a simple and easy method, but it produced instability on overall signal. Therefore, a new test fixture is designed to maximize its reproducibility. Repeatability test will be used to show its effectiveness on Power MOSFET. In addition, with the test fixture, the standard deviation for impedance results was σ=0.12 based on the same part for eight times measurement, compare to σ=3.26 with hand probing. Therefore a significant improvement on the repeatability test was clearly demonstrated.
Keywords
power MOSFET; semiconductor device testing; time-domain reflectometry; TDR measurement; power MOSFET; repeatability test; signal instability; time domain reflectometry measurement; Fixtures; Force; Impedance; Impedance measurement; MOSFET; Probes; Transmission line measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits (IPFA), 2014 IEEE 21st International Symposium on the
Conference_Location
Marina Bay Sands
ISSN
1946-1542
Print_ISBN
978-1-4799-3931-2
Type
conf
DOI
10.1109/IPFA.2014.6898150
Filename
6898150
Link To Document