DocumentCode :
2358325
Title :
Tunneling in nanoscale silicon particles embedded in an a-SiO/sub 2/ matrix
Author :
Tsu, R. ; Boeringer, D.W. ; Nicollian, E.H.
Author_Institution :
North Carolina Univ., Charlotte, NC, USA
fYear :
1996
fDate :
26-26 June 1996
Firstpage :
178
Lastpage :
179
Abstract :
The starting point of our endeavor, in the realization of a resonant tunneling structure in silicon, is based on the fact that sufficiently small particles with dimensions below the electron mean free path should exhibit quantum effects resulting in a series of resonant tunneling similar to resonant tunneling through a double barrier quantum well structure. A diode structure was fabricated with a thin layer (10-20 nm) of nanoscale silicon particles embedded in an a-SiO/sub 2/ matrix between an n-type silicon substrate and an aluminum contact. Discrete sharp conductance peaks, having linewidth of 25-30 meV, were observed even at room temperature.
Keywords :
elemental semiconductors; nanostructured materials; resonant tunnelling diodes; silicon; silicon compounds; Si-SiO/sub 2/; amorphous SiO/sub 2/ matrix; conductance oscillations; nanoscale silicon particles; quantum effects; resonant tunneling diode; Aluminum; Current measurement; Electrical resistance measurement; Electrons; Light emitting diodes; Quantum dots; Resonant tunneling devices; Silicon; Time measurement; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference, 1996. Digest. 54th Annual
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-3358-6
Type :
conf
DOI :
10.1109/DRC.1996.546427
Filename :
546427
Link To Document :
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