Title :
Fabrication of nanodevices using sub-25 nm imprint lithography
Author :
Krauss, P.R. ; Renstrom, P.J. ; Chou, S.Y.
Author_Institution :
Dept. of Electr. Eng., Minnesota Univ., Minneapolis, MN, USA
Abstract :
The key obstacle that prevents many nanostructures and nanodevices from becoming economically viable is the lack of a high-throughput and low-cost nanolithography method. Recently, a high-throughput and low-cost nanolithography method, imprint lithography, has been proposed and demonstrated. Here, we report new progress in imprint lithography and the first fabrication of nanodevices (such as MSM photodetectors and Si quantum wire transistors) using imprint lithography. In imprint lithography a mold with nanoscale features is first pressed into a resist film cast on a substrate to create a thickness contrast pattern in the resist. After removing the mold, an anisotropic etching process is used to transfer the pattern through the entire resist thickness by removing the remaining resist in the compressed areas.
Keywords :
electron beam lithography; etching; nanotechnology; photodetectors; semiconductor quantum wires; semiconductor technology; MSM photodetectors; anisotropic etching process; electron beam lithography; imprint lithography; nanodevices; nanolithography method; nanostructures; quantum wire transistors; resist film; thickness contrast pattern; Anisotropic magnetoresistance; Etching; Fabrication; Lithography; Nanolithography; Nanostructures; Photodetectors; Resists; Substrates; Wire;
Conference_Titel :
Device Research Conference, 1996. Digest. 54th Annual
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-3358-6
DOI :
10.1109/DRC.1996.546433