DocumentCode
2358683
Title
1991 Proceedings, Seventh Annual IEEE Semiconductor Thermal Measurement and Management Symposium (Cat. No.91CH2972-8)
fYear
1991
fDate
12-14 Feb. 1991
Abstract
The following topics are dealt with: analytical modeling; measurement techniques; thermal characterization; and analytical and computational modeling
Keywords
integrated circuit technology; packaging; printed circuits; semiconductor technology; thermal analysis; thermal variables measurement; analytical modeling; analytical models; computational modeling; measurement techniques; printed circuits; semiconductor processing; thermal characterization; thermal management; thermal measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 1991. SEMI-THERM VII. Proceedings., Seventh Annual IEEE
Conference_Location
Phoenix, AZ, USA
Print_ISBN
0-87942-664-0
Type
conf
DOI
10.1109/STHERM.1991.152931
Filename
152931
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