Title :
Radiofrequency susceptibility tests on medical equipment
Author :
Tan, Kok-Swang ; Hinberg, Irwin
Author_Institution :
Health Protection Branch, Med. Devices Bureau, Ottawa, Ont., Canada
Abstract :
The most recent problems of electromagnetic interference (EMI) with medical equipment arise from the widespread use of portable cellular phones and two-way radios in critical care areas of hospitals. The Medical Devices Bureau has studied the effects of radiated electric fields on eight different types of monitoring and therapeutic medical equipment over the frequency range of 1 MHz-2000 MHz. The test protocol was based on the IEC standard 801-3 (1984). Seven of the eight devices tested did not meet the requirements of Severity Level 3 of IEC standard 801-3 (immunity to fields of 10 V/m). Six of the eight failed to meet Severity Level 2 (immunity to 3 V/m) as prescribed by IEC standard 601-1-2 for medical electrical equipment. These preliminary findings indicate that care should be taken when operating VHF radios, UHF radios and cellular phones within one meter of these devices
Keywords :
biomedical equipment; 1 to 2000 MHz; ECG; EMI; IEC standard 601-1-2; IEC standard 801-3; Medical Devices Bureau; Severity Level 2; Severity Level 3; UHF radios; VHF radios; cellular phones; critical care areas; defibrillator; electromagnetic interference; fetal monitor; frequency range; hospitals; infant incubator; infusion pump; medical electrical equipment; medical equipment; monitoring medical equipment; oximeter; physiologic monitor; portable cellular phones; radiated electric fields; radiofrequency susceptibility tests; test protocol; therapeutic medical equipment; two-way radios; ventilator; Biomedical equipment; Biomedical monitoring; Cellular phones; Electromagnetic interference; Hospitals; IEC standards; Immune system; Medical tests; Radio frequency; Testing;
Conference_Titel :
Engineering in Medicine and Biology Society, 1994. Engineering Advances: New Opportunities for Biomedical Engineers. Proceedings of the 16th Annual International Conference of the IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
0-7803-2050-6
DOI :
10.1109/IEMBS.1994.415252