• DocumentCode
    2359535
  • Title

    Author index

  • fYear
    2003
  • fDate
    30-30 May 2003
  • Firstpage
    125
  • Lastpage
    125
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocessor Test and Verification: Common Challenges and Solutions, 2003. Proceedings. 4th International Workshop on
  • Conference_Location
    Austin, TX, USA
  • Print_ISBN
    0-7695-2045-6
  • Type

    conf

  • DOI
    10.1109/MTV.2003.1250273
  • Filename
    1250273