Title :
An intelligent defect inspection technique for color filter
Author :
Chang, Chung-Lung ; Chang, Hsin-Hung ; Hsu, Chia-Pin
Author_Institution :
Mech. Industry Res. Lab., Ind. Technol. Res. Inst., Hsinchu, Taiwan
Abstract :
Automatic defect inspection systems are becoming more and more important in industrial production lines. Especially in electronics industry, an attempt is often made to achieve almost 100% quality control of all components and final goods. Here we are interested in the defect inspection of color filter, which is one of components in TFT-LCD module and gives each pixel of LCD its own color. The difficulties in the defect inspection of color filter are its complex texture and demand for high-speed processing. In this paper, we propose a neural-fuzzy-inference-network (NFIN)-based defect inspection algorithm to detect the materials with regular pattern such as color filter. The NFIN, which is basically a fuzzy inference system and its fuzzy rules and corresponding parameters can be learned by neural network automatically, is a good alternative to achieve the defect inspection. Experimental results show that the proposed algorithm is a promising method to detect the defects of color filter. The proposed algorithm can apply to not only the detection of color filter but also the detection of web materials.
Keywords :
automatic optical inspection; fuzzy neural nets; fuzzy reasoning; learning (artificial intelligence); liquid crystal displays; optical filters; production engineering computing; quality control; TFT-LCD module; automatic systems; color filter; electronics industry; fuzzy rules; intelligent defect inspection technique; neural network learning; neural-fuzzy-inference-network-based defect inspection algorithm; quality control; web materials; Color; Electrical equipment industry; Electronics industry; Filters; Fuzzy neural networks; Fuzzy systems; Inference algorithms; Inspection; Production systems; Quality control;
Conference_Titel :
Mechatronics, 2005. ICM '05. IEEE International Conference on
Conference_Location :
Taipei
Print_ISBN :
0-7803-8998-0
DOI :
10.1109/ICMECH.2005.1529388