Characterization of radiometric transfer standards based on silicon trap detectors

Author

Menegotto, Thiago ; Ferreira da Silva, T. ; Simoes, M. ; Sousa, Willian A. ; Borghi, Giacomo

Author_Institution

Opt. Metrol. Div., Nat. Inst. of Metrol., Quality & Technol., Brazil

fYear

2014

fDate

24-29 Aug. 2014

Firstpage

148

Lastpage

149

Abstract

We present the characterization of the properties of the silicon trap detectors used in the construction of the traceability chain for radiometry at the Brazilian Institute of Metrology - Inmetro. These devices are used as standards for radiometry and photometry in the transfer of the optical power scale of the primary cryogenic radiometer standard. The experimental results for the spatial non-uniformity, polarization dependence and spectral responsivity are shown and discussed.

Keywords

cryogenics; elemental semiconductors; optical sensors; photometry; power measurement; radiometry; silicon; transfer standards; Brazilian Institute of Metrology; Inmetro; Si; optical power scale; photometry; polarization dependence; primary cryogenic radiometer standard; radiometric transfer standard; silicon trap detector; spatial non-uniformity; spectral responsivity; Detectors; Laser beams; Measurement by laser beam; Optical polarization; Optical reflection; Radiometry; Standards; Optical metrology; Optical standards; Radiometry; Spectral responsivity;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on

Conference_Location

Rio de Janeiro

ISSN

0589-1485

Print_ISBN

978-1-4799-5205-2

Type

conf

DOI

10.1109/CPEM.2014.6898302

Filename

6898302