• DocumentCode
    236199
  • Title

    SIM comparison of AC-DC current transfer difference, SIM.EM-K12

  • Author

    Di Lillo, L. ; Yasuda, Eliana ; Lipe, Thomas ; Campos, Sergio ; Spaggiari, A. ; Slomovitz, Daniel ; Faverio, Carlos ; Filipski, Piotr ; Vasconcellos, Renata ; Geronymo, Gean ; Afonso, Renato ; Halawa, Mamdouh

  • fYear
    2014
  • fDate
    24-29 Aug. 2014
  • Firstpage
    268
  • Lastpage
    269
  • Abstract
    A key comparison of the AC-DC current transfer difference has been carried out by the Inter-American Metrology System (SIM) Regional Metrology Organization (RMO). Its purpose was to establish an equivalence of AC-DC current transfer difference at 10 mA and 5 A between the national metrology institutes (NMIs), in support of the International Committee for Weights and Measures (CIPM) Mutual Recognition Agreement (MRA). The comparison artifact was a Planar Multijunction Thermal Converter (PMJTC) at 10 mA and a 5 A shunt at 5 A measurements. Six SIM NMIs participated in the comparison as well as NIS, National Institute of Standard of Egypt. Results linking the SIM.EM-K12 to CCEM-K12 show agreement of SIM NMIs to other RMOs.
  • Keywords
    convertors; electric current measurement; measurement standards; AC-DC current transfer difference; CIPM; Egypt; Inter-American Metrology System; International Committee for Weights and Measures; MRA; Mutual Recognition Agreement; NIS; NMI; National Institute of Standard; PMJTC; RMO; Regional Metrology Organization; SIM.EM-K12; current 10 mA; current 5 mA; national metrology institute; planar multijunction thermal converter; Atmospheric measurements; Current measurement; Measurement uncertainty; NIST; Particle measurements; Uncertainty; AC-DC; Measurement; current transfer difference; measurement standards; measurement techniques; measurement uncertainty; precision measurements; uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4799-5205-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2014.6898362
  • Filename
    6898362