• DocumentCode
    2363099
  • Title

    Impact of lead-free soldering processes on the performance of signal relay contacts

  • Author

    Johler, Werner

  • Author_Institution
    TYCO ELECTRONICS AXICOM, Switzerland
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    43
  • Lastpage
    55
  • Abstract
    Up to now, mainly tin-lead alloys have been used in electronics. The process temperatures usually applied have been in the range of 230°C. All currently discussed lead-free alternatives for professional electronics need process temperatures which are at least 30° higher. In addition, the process duration is significantly longer. The combination of higher process temperatures and longer duration together results in a significant thermal stress on the precision mechanics of the relay. In order to guarantee proper functioning of the relay after the solder process with maximum process temperatures of 255°C, the dimensional changes of the plastic parts must be less than a few micrometers in order to guarantee stable contact forces. The outgassing of the used insulating and sealing materials must be minimal in order not to pollute or contaminate the contacts. With the lead-free version of the IM relay, an identical performance and the same reliability during electrical and climatic endurance tests can be expected, even though relays were processed with typical lead-free soldering processes with temperatures up to 255°C.
  • Keywords
    contact resistance; relays; soldering; surface mount technology; thermal stresses; 230 to 255 degC; contact forces; dimensional changes; endurance tests; lead-free soldering processes; precision mechanics; process temperatures; reliability; signal relay contacts; thermal stress; Contacts; Environmentally friendly manufacturing techniques; Insulation; Lead; Plastics; Relays; Signal processing; Soldering; Temperature distribution; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Contacts, 2002. Proceedings of the Forty-Eighth IEEE Holm Conference on
  • Print_ISBN
    0-7803-7433-9
  • Type

    conf

  • DOI
    10.1109/HOLM.2002.1040821
  • Filename
    1040821