DocumentCode
2363141
Title
Reliability analysis and failure prediction study of dynamic contact resistance on contact
Author
Li, Zhigang ; Jiang, Dong ; Li, Wenhua ; Su, Xiuping ; Guo, Hui
Author_Institution
Electr. Apparatus Inst., Hebei Univ. of Technol., Tianjin, China
fYear
2002
fDate
2002
Firstpage
61
Lastpage
65
Abstract
In previous research, a new testing instrument for dynamic contact resistance of a low capacity contact was developed, and, by means of this testing instrument, we carried out a series of experiments. In the experiments, we tested several types of industrial control relays under different environmental conditions, and accumulated experimental data. In this paper, our further research mainly focuses on the dynamic changing principle of dynamic contact resistances on the contact while contact time and operation times increase. Several characteristic values are distilled in the experimental data. We analyze these characteristic values using a statistical method of time sequences and draw some statistical conclusions. According to these conclusions, the reliability analysis and failure prediction method are further discussed.
Keywords
contact resistance; electrical contacts; electron device testing; failure analysis; relays; reliability; statistical analysis; test equipment; contact characteristic values; contact operation times; contact time; dynamic changing principle; dynamic contact resistance; electrical apparatus reliability; environmental conditions; failure prediction; industrial control relays; low capacity contact; reliability analysis; statistical time sequence method; testing instrument; Contact resistance; Data analysis; Electrical resistance measurement; Electromagnetic measurements; Failure analysis; Instruments; Relays; Statistical analysis; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 2002. Proceedings of the Forty-Eighth IEEE Holm Conference on
Print_ISBN
0-7803-7433-9
Type
conf
DOI
10.1109/HOLM.2002.1040823
Filename
1040823
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