DocumentCode :
236391
Title :
The leakage resistance to ground of a NIST Programmable Josephson Voltage Standard
Author :
Solve, S. ; Chayramy, R. ; Rufenacht, Alain ; Burroughs, Charles J. ; Benz, Samuel P.
Author_Institution :
Bur. Int. des Poids et Mesures (BIPM), Sevres, France
fYear :
2014
fDate :
24-29 Aug. 2014
Firstpage :
462
Lastpage :
463
Abstract :
The Programmable Josephson Voltage Standard (PJVS) leakage resistance to ground (LRG) is defined as the electrical resistance of one side of the measurement leads to ground. Under certain measurement conditions, this resistance can produce a significant systematic voltage error of the measured value of the PJVS output voltage. In particular, if the low side of the array is grounded, for instance in a direct comparison measurement with another JVS, then the LRG will reduce the PJVS output voltage. At 10 V, an error of 0.5 nV can result from a LRG of 50 GΩ if the measurement leads have a total resistance of 2.5 Ω. The LRG and the path of the leakage current to ground are difficult to determine. Furthermore, its corresponding voltage error is still present while the bias source is in operation to control the PJVS. It is therefore important to apply different measurement techniques to compare the corresponding LRG values.
Keywords :
Josephson effect; electric resistance measurement; leakage currents; NIST Programmable Josephson Voltage Standard; electrical resistance; leakage resistance; resistance 2.5 ohm; resistance 50 Gohm; voltage 10 V; Battery charge measurement; Current measurement; Electrical resistance measurement; Measurement uncertainty; Resistance; Standards; Voltage measurement; 10 V programmable array of Josephson junctions; Isolation resistance; Josephson Voltage Standard; Leakage resistance to ground; Primary Voltage Standard;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
Conference_Location :
Rio de Janeiro
ISSN :
0589-1485
Print_ISBN :
978-1-4799-5205-2
Type :
conf
DOI :
10.1109/CPEM.2014.6898459
Filename :
6898459
Link To Document :
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