• DocumentCode
    236391
  • Title

    The leakage resistance to ground of a NIST Programmable Josephson Voltage Standard

  • Author

    Solve, S. ; Chayramy, R. ; Rufenacht, Alain ; Burroughs, Charles J. ; Benz, Samuel P.

  • Author_Institution
    Bur. Int. des Poids et Mesures (BIPM), Sevres, France
  • fYear
    2014
  • fDate
    24-29 Aug. 2014
  • Firstpage
    462
  • Lastpage
    463
  • Abstract
    The Programmable Josephson Voltage Standard (PJVS) leakage resistance to ground (LRG) is defined as the electrical resistance of one side of the measurement leads to ground. Under certain measurement conditions, this resistance can produce a significant systematic voltage error of the measured value of the PJVS output voltage. In particular, if the low side of the array is grounded, for instance in a direct comparison measurement with another JVS, then the LRG will reduce the PJVS output voltage. At 10 V, an error of 0.5 nV can result from a LRG of 50 GΩ if the measurement leads have a total resistance of 2.5 Ω. The LRG and the path of the leakage current to ground are difficult to determine. Furthermore, its corresponding voltage error is still present while the bias source is in operation to control the PJVS. It is therefore important to apply different measurement techniques to compare the corresponding LRG values.
  • Keywords
    Josephson effect; electric resistance measurement; leakage currents; NIST Programmable Josephson Voltage Standard; electrical resistance; leakage resistance; resistance 2.5 ohm; resistance 50 Gohm; voltage 10 V; Battery charge measurement; Current measurement; Electrical resistance measurement; Measurement uncertainty; Resistance; Standards; Voltage measurement; 10 V programmable array of Josephson junctions; Isolation resistance; Josephson Voltage Standard; Leakage resistance to ground; Primary Voltage Standard;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements (CPEM 2014), 2014 Conference on
  • Conference_Location
    Rio de Janeiro
  • ISSN
    0589-1485
  • Print_ISBN
    978-1-4799-5205-2
  • Type

    conf

  • DOI
    10.1109/CPEM.2014.6898459
  • Filename
    6898459