Title :
A Novel Approach for Improving the Quality of Open Fault Diagnosis
Author :
Yamazaki, Koji ; Tsutsumi, Toshiyuki ; Takahashi, Hiroshi ; Higami, Yoshinobu ; Aikyo, Takashi ; Takamatsu, Yuzo ; Yotsuyanagi, Hiroyuki ; Hashizume, Masaki
Abstract :
With the shrinking process technologies and the use of copper process, open defects on interconnect wires, contacts and vias often cause failure. Development of an efficient fault diagnosis method for open faults is desired. However, the diagnosis method for open faults has not been established yet. In this paper, we propose a novel approach for improving the diagnostic quality of open faults by introducing a threshold function in which the logical value of the line with open defect depends on the weighted logical values of its adjacent lines. By using the threshold function, we can deduce not only a faulty line but also an open defect site at the faulty line. Experimental results show that the proposed method can identify an exact faulty line in most cases with a very small computation cost. The proposed method can also identify the open defect site within 25%-length of the faulty line.
Keywords :
circuit testing; fault diagnosis; logic gates; logic testing; circuit fault diagnosis; copper process; faulty line deduction; interconnect wires; logic gates circuit; open fault diagnosis; threshold function; Circuit faults; Computational efficiency; Copper; Costs; Fault diagnosis; Logic functions; Testing; Threshold voltage; Very large scale integration; Wires; adjacent line; fault diagnosis; open faults; pass/fail information;
Conference_Titel :
VLSI Design, 2009 22nd International Conference on
Conference_Location :
New Delhi
Print_ISBN :
978-0-7695-3506-7
DOI :
10.1109/VLSI.Design.2009.53