• DocumentCode
    2366474
  • Title

    Exploring the Limits of Port Reduction in Centralized Register Files

  • Author

    Sirsi, Sandeep ; Aggarwal, Aneesh

  • Author_Institution
    Electr. & Comput. Eng. Dept., Binghamton Univ., Binghamton, NY
  • fYear
    2009
  • fDate
    5-9 Jan. 2009
  • Firstpage
    535
  • Lastpage
    540
  • Abstract
    Register file access falls on the critical path of a microprocessor because large heavily ported register files are used to exploit more parallelism. In this paper, we focus on reducing register file complexity by reducing the number of register file read ports. The goal of this paper is to explore the limits of read port reduction in a centralized integer register file i.e. how few read ports can be provided to a centralized integer register file, while still maintaining performance? A naive port reduction may result in significant performance degradation and does not give a true measure of the limits, while clever techniques may be able to further reduce the number of ports. Hence, in this paper, we drastically reduce the number of ports and then investigate techniques to improve the performance of the reduced-ported register file. Our experiments show that the techniques allow further port reduction by improving the performance from reduced-ported RFs. For instance, with our experimental parameters, the naive port reduction method requires at least five read ports to maintain a performance impact of less than 5%, whereas, our techniques require only three ports.
  • Keywords
    file organisation; microprocessor chips; centralized register files; complexity reduction; microprocessor; read port reduction; Clocks; Concurrent computing; Degradation; Design engineering; Microprocessors; Parallel processing; Processor scheduling; Radio frequency; Registers; Very large scale integration; Complexity-effective design; Instructions per cycle; Port reduction; Register file;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 2009 22nd International Conference on
  • Conference_Location
    New Delhi
  • ISSN
    1063-9667
  • Print_ISBN
    978-0-7695-3506-7
  • Type

    conf

  • DOI
    10.1109/VLSI.Design.2009.29
  • Filename
    4749727