Title :
Immediate elimination of gross ESD failures in PLCC MECL product line through innovative techniques
Author :
Almazar, Rudy ; Hoffman, Barry
Author_Institution :
Motorola Philippines Inc., Philippines
Abstract :
Sudden gross ESD failures occurred on MECL 10 H 20 LDS PLCC devices. This affected the yield with deterioration by 22× and electrical AOQ from permanent six-sigma to 170×. These problems influenced the cycle time, with rapid deterioration; as a result, the whole manufacturing process of 10 H devices was suspended. Through charge mapping, statistical experiments, and innovative techniques, the process inducing ESD damage was narrowed down and the root cause immediately corrected. This resulted in the fast restoration of the PLCC 10 H assembly and test operation.
Keywords :
bipolar logic circuits; electrostatic discharge; emitter-coupled logic; failure analysis; integrated circuit measurement; integrated circuit packaging; integrated circuit reliability; integrated circuit yield; plastic packaging; statistical analysis; MECL 10 H 20 LDS PLCC devices; PLCC MECL product line; assembly; charge mapping; cycle time; electrical AOQ; gross ESD failures; statistical experiments; yield; Bipolar transistor logic devices; Electrostatic discharges; Emitter coupled logic; Failure analysis; Integrated circuit measurements; Integrated circuit packaging; Integrated circuit reliability; Plastic packaging; Statistics; Yield estimation;
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium, 1996. Proceedings
Print_ISBN :
1-878303-69-4
DOI :
10.1109/EOSESD.1996.865132
