Substrate injection characterization in CMOS mixed signal systems on chip

Author

du Roscoat, Laure Rolland ; Hourany, J. ; Regnauld, V. ; Gamand, P.

Author_Institution

Innovation Center for Radio Frequency NXP Semicond., Caen

fYear

2007

fDate

2-5 July 2007

Firstpage

25

Lastpage

28

Abstract

With the increasing integration in consumer electronic products, complex mixed signals circuits have been developed for RF systems on chip. Digital blocks generate parasitic signals, which may affect sensitive sections, especially through substrate. This paper presents a measurement structure designed to characterize the signals injected into the substrate. Measurements of digital blocks designed with various layout options will allow to find a better layout methodology to improve isolation between design blocks in a 65nm CMOS technology.

Keywords

CMOS integrated circuits; consumer electronics; system-on-chip; CMOS mixed signal; RF systems; consumer electronic; digital blocks; parasitic signals; size 65 nm; substrate injection characterization; systems on chip; CMOS technology; Consumer electronics; Integrated circuit measurements; Isolation technology; RF signals; Radio frequency; Semiconductor device measurement; Signal design; Signal generators; System-on-a-chip;

fLanguage

English

Publisher

ieee

Conference_Titel

Research in Microelectronics and Electronics Conference, 2007. PRIME 2007. Ph.D.

Conference_Location

Bordeaux

Print_ISBN

978-1-4244-1000-2

Electronic_ISBN

978-1-4244-1001-9

Type

conf

DOI

10.1109/RME.2007.4401802

Filename

4401802