DocumentCode
236929
Title
Susceptibility of notebook computers to HPM
Author
Murata, Y. ; Hoshina, Takashi ; Hatori, Yoshifumi
Author_Institution
Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Amagasaki, Japan
fYear
2014
fDate
4-8 Aug. 2014
Firstpage
549
Lastpage
553
Abstract
In this paper, we evaluate the susceptibility of notebook computers to high power microwave (HPM) pulses. We have developed a HPM test instrument with stripline structure. The structures of the test instrument are investigated through finite-difference time domain (FDTD) analysis to get homogeneous electromagnetic fields inside the instrument. The developed instrument can apply a 2.7 kV/m electric field below 3 GHz with using a 100 W power amplifier. The stripline instrument is an open structure, which can easily apply electric fields to a specific part of notebook computers. The HPM pulses were applied to the main body of notebook computers. We obtained the frequencies of the HPM pulses at which the notebook computer operation has failed. Radiated susceptibility tests were also carried out on notebook computers with an antenna. The computer failure frequencies of the test instrument agree with the failure frequencies from observed during the radiated susceptibility test. Our test instrument is useful for preliminary test of notebook computers and for investigating the effective HPM pulse condition.
Keywords
electromagnetic fields; electromagnetic pulse; finite difference time-domain analysis; notebook computers; power amplifiers; FDTD analysis; HPM; HPM test instrument; computer failure frequencies; electric field; finite-difference time domain; high power microwave pulses; homogeneous electromagnetic fields; notebook computer operation; notebook computers susceptibility; open structure; power amplifier; radiated susceptibility tests; stripline instrument; test instrument; Antennas; Computers; Connectors; Electric fields; Finite difference methods; Instruments; Stripline;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2014 IEEE International Symposium on
Conference_Location
Raleigh, NC
Print_ISBN
978-1-4799-5544-2
Type
conf
DOI
10.1109/ISEMC.2014.6899032
Filename
6899032
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