Title :
A 1.2V 10b 20MSample/s non-binary successive approximation ADC in 0.13/spl mu/m CMOS
Author_Institution :
Infineon Technologies AG, Microelectronics Design Centers Austria
Keywords :
Approximation algorithms; Area measurement; CMOS process; CMOS technology; Capacitors; Decoding; Error compensation; Frequency measurement; Measurement standards; Power measurement;
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
DOI :
10.1109/ISSCC.2002.992181
