• DocumentCode
    2371246
  • Title

    Conformance Test Suite for CBEFF Biometric Information Records

  • Author

    Lee, Yooyoung ; Podio, Fernando L. ; Jerde, Mark

  • Author_Institution
    Chung-Ang Univ., Seoul
  • fYear
    2007
  • fDate
    27-29 Sept. 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Deployment of standards-based biometric technologies is expected to significantly raise levels of security for critical infrastructures that has not been possible to date with other technologies. These systems require a comprehensive set of technically sound standards that meet the customer´s needs. The existence of standards alone, however, is not enough to demonstrate that products meet the technical requirements specified in the standards. Conformance testing captures the technical description of a standard and measures whether an implementation faithfully implements the standard. Conformity assessment provides confidence to users through programs that demonstrate the conformity of products to specific standards. This paper discusses a conformance test suite (CTS) for biometric information records (BIRs) claiming conformance to data structures specified in common biometric exchange formats framework (CBEFF) standards. The paper summarizes conformance testing procedures and criteria for testing these data structures. A conformance testing architecture and a CTS implementation developed at the National Institute of Standards and Technology (NIST) to assess conformance to these CBEFF data structures is described. Ongoing and future work is discussed.
  • Keywords
    biometrics (access control); conformance testing; data structures; biometric information records; common biometric exchange formats framework standards; conformance test suite; critical infrastructures security; data structures; Bioinformatics; Biometrics; Computer security; Data structures; ISO standards; Information technology; Measurement standards; NIST; Standards development; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Biometrics: Theory, Applications, and Systems, 2007. BTAS 2007. First IEEE International Conference on
  • Conference_Location
    Crystal City, VA
  • Print_ISBN
    978-1-4244-1596-0
  • Electronic_ISBN
    978-1-4244-1597-7
  • Type

    conf

  • DOI
    10.1109/BTAS.2007.4401931
  • Filename
    4401931