DocumentCode
2371246
Title
Conformance Test Suite for CBEFF Biometric Information Records
Author
Lee, Yooyoung ; Podio, Fernando L. ; Jerde, Mark
Author_Institution
Chung-Ang Univ., Seoul
fYear
2007
fDate
27-29 Sept. 2007
Firstpage
1
Lastpage
4
Abstract
Deployment of standards-based biometric technologies is expected to significantly raise levels of security for critical infrastructures that has not been possible to date with other technologies. These systems require a comprehensive set of technically sound standards that meet the customer´s needs. The existence of standards alone, however, is not enough to demonstrate that products meet the technical requirements specified in the standards. Conformance testing captures the technical description of a standard and measures whether an implementation faithfully implements the standard. Conformity assessment provides confidence to users through programs that demonstrate the conformity of products to specific standards. This paper discusses a conformance test suite (CTS) for biometric information records (BIRs) claiming conformance to data structures specified in common biometric exchange formats framework (CBEFF) standards. The paper summarizes conformance testing procedures and criteria for testing these data structures. A conformance testing architecture and a CTS implementation developed at the National Institute of Standards and Technology (NIST) to assess conformance to these CBEFF data structures is described. Ongoing and future work is discussed.
Keywords
biometrics (access control); conformance testing; data structures; biometric information records; common biometric exchange formats framework standards; conformance test suite; critical infrastructures security; data structures; Bioinformatics; Biometrics; Computer security; Data structures; ISO standards; Information technology; Measurement standards; NIST; Standards development; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Biometrics: Theory, Applications, and Systems, 2007. BTAS 2007. First IEEE International Conference on
Conference_Location
Crystal City, VA
Print_ISBN
978-1-4244-1596-0
Electronic_ISBN
978-1-4244-1597-7
Type
conf
DOI
10.1109/BTAS.2007.4401931
Filename
4401931
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