Title :
Minimum test sets for locally exhaustive testing of combinational circuits with five outputs
Author :
Yokohira, Tokumi ; Shimizu, Toshimi ; Michinishi, Hiroyuki ; Sugiyama, Yuji ; Okamoto, Takuji
Author_Institution :
Fac. of Eng., Okayama Univ., Japan
Abstract :
In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2 w test patterns, where w is the maximum number of inputs on which any output depends
Keywords :
combinational circuits; logic testing; matrix algebra; combinational circuits; dependence matrices; equivalent dependence matrix; locally exhaustive testing; minimum test sets; test patterns; Automatic testing; Circuit faults; Circuit testing; Combinational circuits; Terminology; Vectors;
Conference_Titel :
Test Symposium, 1994., Proceedings of the Third Asian
Conference_Location :
Nara
Print_ISBN :
0-8186-6690-0
DOI :
10.1109/ATS.1994.367218
