• DocumentCode
    2373674
  • Title

    Investigation of generation process in narrowband MIS structures

  • Author

    Nastovjak, Artem E. ; Polovinkin, Vladimir G.

  • Author_Institution
    Inst. of Semicond. Phys. SB RAS, Novosibirsk
  • fYear
    2008
  • fDate
    1-5 July 2008
  • Firstpage
    76
  • Lastpage
    78
  • Abstract
    in the paper method of automatic measurements of non-equilibrium depletion relaxation in MIS structures was offered. Simple relaxation process model based on assumption of infinite capacitance of inversion layer was proposed.
  • Keywords
    MIS structures; automatic measurements; infinite capacitance; inversion layer; narrowband MIS structures; nonequilibrium depletion relaxation; relaxation process model; Narrowband; CID; IR FPA; MIS; Non-equilibrium depletion; relaxation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices and Materials, 2008. EDM 2008. 9th International Workshop and Tutorials on
  • Conference_Location
    Novosibirsk
  • ISSN
    1815-3712
  • Print_ISBN
    978-5-7782-0893-3
  • Type

    conf

  • DOI
    10.1109/SIBEDM.2008.4585872
  • Filename
    4585872
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2373674