DocumentCode
2374155
Title
BAW resonators reliability in the GHz range
Author
Ivira, B. ; Fillit, R.Y. ; Benech, Ph ; Ndagijimana, F. ; Parat, G. ; Ancey, P.
Author_Institution
Inst. of Microelectronics, Electromagn. & Photonics, Grenoble
fYear
2006
fDate
6-10 Nov. 2006
Firstpage
3133
Lastpage
3138
Abstract
Bulk acoustic wave (BAW) resonators are very promising candidates for Giga Hertz applications. In this context it becomes really important to analyse the behavior of these structures under harsh environmental conditions and severe operating conditions. A contribution to reliability studies of film bulk acoustic resonators (FBAR) and particularly solidly mounted resonators (SMR) is presented. X-rays and RF measurements allowed electrical and structural aging assessment in microstructures. For this purpose two experimental benches were set-up: one X-ray based (including diffraction, radiography and fluorescence analysis) and a very high-spatial resolution infrared, in-situ thermal mapping apparatus. In fine, some advices are formulated for the future realization of SMR
Keywords
acoustic microwave devices; acoustic resonators; ageing; bulk acoustic wave devices; reliability; BAW resonators reliability; X-ray based diffraction; bulk acoustic wave; film bulk acoustic resonators; high-spatial resolution infrared; in-situ thermal mapping apparatus; solidly mounted resonators; structural aging assessment; Acoustic diffraction; Acoustic measurements; Acoustic waves; Aging; Electric variables measurement; Film bulk acoustic resonators; Microstructure; Radio frequency; Radiography; X-ray diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
IEEE Industrial Electronics, IECON 2006 - 32nd Annual Conference on
Conference_Location
Paris
ISSN
1553-572X
Print_ISBN
1-4244-0390-1
Type
conf
DOI
10.1109/IECON.2006.347778
Filename
4153507
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