• DocumentCode
    2374155
  • Title

    BAW resonators reliability in the GHz range

  • Author

    Ivira, B. ; Fillit, R.Y. ; Benech, Ph ; Ndagijimana, F. ; Parat, G. ; Ancey, P.

  • Author_Institution
    Inst. of Microelectronics, Electromagn. & Photonics, Grenoble
  • fYear
    2006
  • fDate
    6-10 Nov. 2006
  • Firstpage
    3133
  • Lastpage
    3138
  • Abstract
    Bulk acoustic wave (BAW) resonators are very promising candidates for Giga Hertz applications. In this context it becomes really important to analyse the behavior of these structures under harsh environmental conditions and severe operating conditions. A contribution to reliability studies of film bulk acoustic resonators (FBAR) and particularly solidly mounted resonators (SMR) is presented. X-rays and RF measurements allowed electrical and structural aging assessment in microstructures. For this purpose two experimental benches were set-up: one X-ray based (including diffraction, radiography and fluorescence analysis) and a very high-spatial resolution infrared, in-situ thermal mapping apparatus. In fine, some advices are formulated for the future realization of SMR
  • Keywords
    acoustic microwave devices; acoustic resonators; ageing; bulk acoustic wave devices; reliability; BAW resonators reliability; X-ray based diffraction; bulk acoustic wave; film bulk acoustic resonators; high-spatial resolution infrared; in-situ thermal mapping apparatus; solidly mounted resonators; structural aging assessment; Acoustic diffraction; Acoustic measurements; Acoustic waves; Aging; Electric variables measurement; Film bulk acoustic resonators; Microstructure; Radio frequency; Radiography; X-ray diffraction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE Industrial Electronics, IECON 2006 - 32nd Annual Conference on
  • Conference_Location
    Paris
  • ISSN
    1553-572X
  • Print_ISBN
    1-4244-0390-1
  • Type

    conf

  • DOI
    10.1109/IECON.2006.347778
  • Filename
    4153507