Title :
Modular fault simulation of mixed signal circuits with fault ranking by severity
Author :
Gomes, Alfred V. ; Voorakaranam, Ramakrishna ; Chatterjee, Abhijit
Author_Institution :
Sch. of Electr. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
In this paper, we propose a novel approach to fault simulation of large mixed signal circuits using circuit partitioning and fault ordering. The conventional statistical fault model is divided, to separately account for global and local variations. We consider the problem of estimating the effect of a parameter deviation in a sub-module, on the system level specifications for a general nonlinear circuit. This method uses a function approximation model to estimate the system response and rank the faults according to the severity. Applications of this algorithm include estimation of fault coverage and forms a key element in test generation and diagnosis procedures
Keywords :
fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; statistical analysis; circuit partitioning; fault coverage; fault ordering; fault ranking; function approximation model; general nonlinear circuit; global variations; local variations; mixed signal circuits; modular fault simulation; parameter deviation; statistical fault model; system level specifications; system response; test diagnosis; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer simulation; Dictionaries; Fault diagnosis; Function approximation; Linear circuits; SPICE;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 1998. Proceedings., 1998 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
0-8186-8832-7
DOI :
10.1109/DFTVS.1998.732184