DocumentCode :
2374361
Title :
FPGA reconfigurability in the presence of logic and I/O faults
Author :
Ho, H. ; Szwarc, V. ; Kwasniewski, T.A.
Author_Institution :
Commun. Res. Centre, Ottawa, Ont., Canada
Volume :
2
fYear :
1997
fDate :
25-28 May 1997
Firstpage :
740
Abstract :
The SRAM FPGA´s reconfigurability is investigated with a view to addressing the problems of reparability through the utilization of a device´s unused logic and routing resources. This is done by remapping the design such that the faulty logic is bypassed. This paper addresses the issue of mapping designs onto FPGAs with single and multiple logic and I/O block faults subject to the constraint that the faults are correctly identified, localized, and excluded from the pool of available logic and I/O cells. The viability of the proposed approach depends on the maintenance, within acceptable performance parameters, of the reconfigured circuit´s throughput and interface characteristics. The reconfigurability of representative complex butterfly circuit in the presence of single and multiple faults is considered and relevant simulation results based on the ORCA 2C40 device are presented
Keywords :
fault diagnosis; field programmable gate arrays; logic testing; multivalued logic circuits; network routing; random-access storage; reconfigurable architectures; FPGA reconfigurability; I/O block faults; ORCA 2C40 device; SRAM FPGA; butterfly circuit; design remapping; interface characteristics; logic faults; multiple logic; reparability; throughput; Circuit faults; Circuit simulation; Fault diagnosis; Field programmable gate arrays; Logic design; Logic devices; Random access memory; Reconfigurable logic; Routing; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Computer Engineering, 1997. Engineering Innovation: Voyage of Discovery. IEEE 1997 Canadian Conference on
Conference_Location :
St. Johns, Nfld.
ISSN :
0840-7789
Print_ISBN :
0-7803-3716-6
Type :
conf
DOI :
10.1109/CCECE.1997.608347
Filename :
608347
Link To Document :
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