Title :
Directional correlation of the irradiated energy from a microcontroller chip
Author :
Zikic, A.M. ; Galbraith, F.S. ; Davenport, N.
Author_Institution :
Univ. of Paisley, UK
Abstract :
The paper proposes an analysis technique of the emission spectra, obtained by using SAE NoJ1752/3 procedure, that may be of interest to both the manufacturing and application communities. The results are used to establish the number, origin, directionality and relationship of detected sources. If a number of the emission spectra have essentially the same distribution of power over the frequency range of interest, the directions are treated as correlated. The technique is illustrated by an example using recorded data from an unknown microcontroller source
Keywords :
electromagnetic interference; microcontrollers; spectral analysis; Pearson´s correlation test; SAE NoJ1752/3 procedure; detected sources; directional correlation; emission spectra; irradiated energy; microcontroller chip; recorded data; significant difference analysis; spectral analysis; system clock influences; unknown microcontroller source; Chip scale packaging; Clocks; Electromagnetic compatibility; Frequency; Microcontrollers; Power harmonic filters; Power measurement; Pulp manufacturing; Silicon; Testing;
Conference_Titel :
Electromagnetic Compatibility, 1997. IEEE 1997 International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-4140-6
DOI :
10.1109/ISEMC.1997.667572
