• DocumentCode
    2376077
  • Title

    A 0.6V 45nm adaptive dual-rail SRAM compiler circuit design for lower VDD_min VLSIs

  • Author

    Chen, Y.H. ; Chan, W.M. ; Chou, S.Y. ; Liao, H.J. ; Pan, H.Y. ; Wu, J.J. ; Lee, C.H. ; Yang, S.M. ; Liu, Y.C. ; Yamauchi, H.

  • Author_Institution
    DTP, Taiwan Semicond. Manuf. Co., Ltd., Hsinchu
  • fYear
    2008
  • fDate
    18-20 June 2008
  • Firstpage
    210
  • Lastpage
    211
  • Abstract
    A 0.6 V 45 nm dual-rail SRAM design utilizing an adaptive voltage regulator targeting for an SRAM compiler application is proposed for the first time. The proposed work describes an adaptive mechanism to generate a cell-Vdd (CVDD), which tracks a certain voltage offset with respect to logic-Vdd (VDD), and provides a mean to lower the VDD down to 0.6 V. To relax IR-drop constraints of CVDD power routings in P&R flow, shifting bite-line (BL) pre-charge power supply from CVDD to VDD is adopted in this work. This also avoids the congestion of the VDD and CVDD power mesh. A 45 nm test chip has demonstrated that these concepts successfully can push the VDD_min down to 0.6 V, which is > 250 mV lower than the conventional single-rail SRAMpsilas.
  • Keywords
    SRAM chips; VLSI; memory architecture; CVDD power routings; VDD_min VLSI; adaptive voltage regulator; bite-line pre-charge power supply; dual-rail SRAM compiler circuit design; size 45 nm; voltage 0.6 V; Circuit synthesis; Power generation; Power supplies; Random access memory; Regulators; Routing; Target tracking; Testing; Very large scale integration; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 2008 IEEE Symposium on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-1804-6
  • Electronic_ISBN
    978-1-4244-1805-3
  • Type

    conf

  • DOI
    10.1109/VLSIC.2008.4586010
  • Filename
    4586010