• DocumentCode
    2376571
  • Title

    Tunability of Ferromagnetic (La,Sr) MnO3 (LSMO) Thin Films for Microwave Applications

  • Author

    Ahmad, Mahmoud Al ; Yun, Eui-Jung ; Cheon, Chae Il ; Plana, Robert

  • Author_Institution
    LAAS-CNRS, Univ. de Toulouse, Toulouse
  • fYear
    2008
  • fDate
    27-31 Oct. 2008
  • Firstpage
    1296
  • Lastpage
    1299
  • Abstract
    Tunability is being driven by a number of very interesting enabling technologies. This work demonstrates the feasibility of ferromagnetic thin film tunability at ambient temperature for radio frequency applications. A 400 nm thick LSMO thin film is formed by the chemical solution deposition (CSD) on the top of indium tin oxide (ITO)/SiO2/Si heterostructure. Interdigitated capacitor metallization is deposited on LSMO thin film. The resistance of the LSMO based heterostructure varies with bias voltage as a consequence of local ferromagnetic ordering due to transport current induced in the material by an applied field. At zero bias, the low impedance measurement indicates that the heterostructure exhibits a lossy capacitance. Under the applied field the heterostructure becomes inductive and the losses are reduced.
  • Keywords
    ferromagnetic materials; indium compounds; lanthanum compounds; magnetic thin films; metallisation; microwave devices; microwave materials; silicon; silicon compounds; strontium compounds; thin film capacitors; CSD; ITO-SiO2-Si; LSMO thin film; LaSrMnO3; chemical solution deposition; ferromagnetic thin film tunability; heterostructure tunable device; interdigitated capacitor metallization; local ferromagnetic ordering; lossy capacitance; microwave applications; size 400 nm; Capacitors; Chemical technology; Indium tin oxide; Metallization; Radio frequency; Semiconductor thin films; Sputtering; Temperature; Transistors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2008. EuMC 2008. 38th European
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-2-87487-006-4
  • Type

    conf

  • DOI
    10.1109/EUMC.2008.4751700
  • Filename
    4751700