• DocumentCode
    2376583
  • Title

    K-shell X-ray yield enhancement from Z-pinches using element mixtures of similar atomic number

  • Author

    Riordan, J.C. ; Deeney, C. ; LePell, P.D. ; Failor, B.H. ; Wong, S.L. ; Apruzese, J.P. ; Thornhill, J.W. ; Whitney, K.G. ; Davis, J. ; Yadlowsky, E.

  • Author_Institution
    Physics Int. Co., San Leandro, CA, USA
  • fYear
    1995
  • fDate
    5-8 June 1995
  • Firstpage
    254
  • Abstract
    Summary form only given, as follows. In recent experiments on the 4-MA, 6-TW Double-EAGLE pulse generator we have increased the K-shell X-ray emission from aluminum wire array Z-pinches by coating the wires with magnesium and/or silicon. Mg-coated aluminum wires gave yield increases of >50% over that of uncoated aluminum wires, and Mg/Si-coated wires presently under test are expected to increase the yield by 100%. Analysis of the time-resolved spectral data shows that two effects contribute to the increased yield. First, the multi-element mixture reduces the opacity of the strongest emission lines, thus increasing the probability of photon escape. Second, the coating plasma reaches the pinch axis earlier, forming a core that is compressed and heated by the imploding mass of aluminum. Since the He-/spl alpha/ and Ly-/spl alpha/ radiation from the core is not absorbed by the outer aluminum, the X-ray yields are increased.
  • Keywords
    X-ray emission spectra; Z pinch; exploding wires; explosions; opacity; plasma diagnostics; plasma properties; time resolved spectra; 4 MA; 6 TW; Al; Al-Mg; Al-Si; He-/spl alpha/ radiation; K-shell X-ray yield enhancement; Ly-/spl alpha/ radiation; X-ray yields; Z-pinches; double-EAGLE pulse generator; element mixtures; imploding mass; multi-element mixture; opacity; photon escape; pinch axis; time-resolved spectral data; Aluminum; Coatings; Fusion power generation; Fusion reactors; Laboratories; Magnetic fields; Nuclear power generation; Physics; Power systems; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
  • Conference_Location
    Madison, WI, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-2669-5
  • Type

    conf

  • DOI
    10.1109/PLASMA.1995.533262
  • Filename
    533262