• DocumentCode
    2376752
  • Title

    Use of interconnect resistance as a reliability tool

  • Author

    Constable, J.H.

  • Author_Institution
    Dept. of Electr. Eng., Binghamton Univ., NY, USA
  • fYear
    1994
  • fDate
    1-4 May 1994
  • Firstpage
    450
  • Lastpage
    457
  • Abstract
    Methods are described which have successfully measured the electrical resistance change induced by strain and fatigue in leaded electrical interconnections. The dependance of electrical resistance on elastic strain, plastic deformation, and cyclic fatigue is examined. A type of spectroscopy for fatigue testing which measures the amplitude of the resistance change at harmonics of the fatigue cycling frequency is described. The spectroscopic method is shown to have the advantage of greater sensitivity, and of providing more information than conventional methods. An analytical frame work is developed, and recently published data for gull-wing leads and lap shear solder joints are examined using it. The cause for the limiting resistance fluctuations in these measurements is investigated. It is argued that after calibration, the method can be used to measure strain level, shorten fatigue tests, and reliably detect interconnect failures
  • Keywords
    circuit reliability; electric resistance; failure analysis; fatigue; packaging; plastic deformation; soldering; calibration; cyclic fatigue; elastic strain; electrical resistance change; electronic packaging; fatigue testing; gull-wing leads; interconnect failures; interconnect resistance; lap shear solder joints; leaded electrical interconnections; limiting resistance fluctuations; plastic deformation; reliability tool; Capacitive sensors; Electric resistance; Electric variables measurement; Electrical resistance measurement; Fatigue; Lead; Plastics; Spectroscopy; Strain measurement; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1994. Proceedings., 44th
  • Conference_Location
    Washington, DC
  • Print_ISBN
    0-7803-0914-6
  • Type

    conf

  • DOI
    10.1109/ECTC.1994.367553
  • Filename
    367553