DocumentCode
2376752
Title
Use of interconnect resistance as a reliability tool
Author
Constable, J.H.
Author_Institution
Dept. of Electr. Eng., Binghamton Univ., NY, USA
fYear
1994
fDate
1-4 May 1994
Firstpage
450
Lastpage
457
Abstract
Methods are described which have successfully measured the electrical resistance change induced by strain and fatigue in leaded electrical interconnections. The dependance of electrical resistance on elastic strain, plastic deformation, and cyclic fatigue is examined. A type of spectroscopy for fatigue testing which measures the amplitude of the resistance change at harmonics of the fatigue cycling frequency is described. The spectroscopic method is shown to have the advantage of greater sensitivity, and of providing more information than conventional methods. An analytical frame work is developed, and recently published data for gull-wing leads and lap shear solder joints are examined using it. The cause for the limiting resistance fluctuations in these measurements is investigated. It is argued that after calibration, the method can be used to measure strain level, shorten fatigue tests, and reliably detect interconnect failures
Keywords
circuit reliability; electric resistance; failure analysis; fatigue; packaging; plastic deformation; soldering; calibration; cyclic fatigue; elastic strain; electrical resistance change; electronic packaging; fatigue testing; gull-wing leads; interconnect failures; interconnect resistance; lap shear solder joints; leaded electrical interconnections; limiting resistance fluctuations; plastic deformation; reliability tool; Capacitive sensors; Electric resistance; Electric variables measurement; Electrical resistance measurement; Fatigue; Lead; Plastics; Spectroscopy; Strain measurement; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1994. Proceedings., 44th
Conference_Location
Washington, DC
Print_ISBN
0-7803-0914-6
Type
conf
DOI
10.1109/ECTC.1994.367553
Filename
367553
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