Title :
FPGA based design of a fine-grained fault tolerant interleaved memory
Author :
Das, S. ; Dey, Shuvashis
Author_Institution :
Dept. of Comput. Sci. & Eng., Univ. Inst. of Technol., Burdwan, India
Abstract :
Memory bandwidth has been the bottleneck of modern computing systems with the advent of increasing processor speed. High speed processors engage themselves dealing data access with comparatively low speed memories resulting poor processor utilizing. Development of a high speed memory system is therefore a challenging domain of research. The concept of interleaved memory systems with high throughput plays a pivotal role in bridging the speed gap between processor and memory. Exploiting fault tolerance within an interleaved memory system makes it functionally more reliable with a trade-off in speed. Word level bypassing of the fault location is a fine grained approach of fault tolerance that can reduce wastage of significant amount of address space. FPGA based design and implementation of such a fault tolerant interleaved memory is proposed in this paper.
Keywords :
fault tolerant computing; field programmable gate arrays; interleaved storage; FPGA based design; data access; fault location; fine-grained fault tolerant interleaved memory; high speed memory system; high speed processors; word level bypassing; Fault tolerance; Fault tolerant systems; Reliability engineering; Memory bandwidth; fault tolerance; field programmable gate array; fine grain; hardware description language; interleaved memory; processor utilization; test bench waveform;
Conference_Titel :
Advanced Communication Control and Computing Technologies (ICACCCT), 2014 International Conference on
Conference_Location :
Ramanathapuram
Print_ISBN :
978-1-4799-3913-8
DOI :
10.1109/ICACCCT.2014.7019150