Title :
A multi-language goal-tree based functional test planning system
Author :
Mahajan, Rajneesh ; Govindarajulu, Ramesh ; Armstrong, J.R. ; Gray, F.G.
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Tech, Blacksburg, VA, USA
Abstract :
This paper presents a multi-language test planning system, which is based on a goal-tree based test methodology. Multi-language support is achieved by adding a common abstraction layer on the top of different language specific details. The effectiveness of this strategy is demonstrated by using this tool for testing VHDL and SystemC models of a GSM system.
Keywords :
design aids; electronic design automation; electronic equipment testing; hardware description languages; mathematical programming; planning; radiotelephony; GSM systems; SystemC models; VHDL model testing; common abstraction layers; goal-tree based test methodology; hardware design; language specific details; multi-language goal-tree based functional test planning system; multi-language support; Automatic testing; Digital signal processing; GSM; Hardware design languages; Information systems; Process design; Process planning; System testing; Tree data structures;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041797
