Experimental evaluation of scan tests for bridges

Author

Chakravarty, Sreejit ; Jain, Ankur ; Radhakrishnan, Nandakumar ; Savage, Eric W. ; Zachariah, Sujit T.

fYear

2002

fDate

2002

Firstpage

509

Lastpage

518

Abstract

An impressive body of theoretical research to model the behavior of bridges exists. We take that a step further and describe an experiment to compute single cycle scan tests for bridges and evaluate them in silicon. Experimental data, on a high volume part, shows that by marginally increasing the static bridge fault coverage of realistic bridges, unique parts missed by a comprehensive set of stuck-at tests were detected. We believe that this is the first silicon data on the value of adding single cycle scan tests for bridges to the manufacturing flow.

Keywords

automatic test pattern generation; boundary scan testing; fault location; integrated circuit reliability; integrated circuit testing; logic testing; production testing; Si; automatic test pattern generation; bridge fault experimental data; defect based scan tests; fault detection; scan test evaluation; single cycle bridge scan tests; static bridge fault coverage; structural testing techniques; stuck-at tests; Application specific integrated circuits; Automatic testing; Bridges; Cost function; Fault detection; Frequency; Manufacturing; Microprocessors; Silicon; Temperature distribution;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2002. Proceedings. International

ISSN

1089-3539

Print_ISBN

0-7803-7542-4

Type

conf

DOI

10.1109/TEST.2002.1041801

Filename

1041801