Title :
Facilitating rapid first silicon debug
Author :
Balachandran, Hari ; Butler, Kenneth M. ; Simpson, Neil
Author_Institution :
Texas Instrum., Dallas, TX, USA
Abstract :
Semiconductor manufacturers aim to deliver products to market within a short span of time in order to gain market share. There are several facets of introducing a product to market - design, manufacturing, first silicon debug, and ramp to volume. Of these, first silicon debug time contributes significantly towards reduced product cycle time if it can be kept short. In this paper, we discuss the infrastructure, design tools, test tools and debug tools required to achieve successful first silicon debug. We describe a production device that employs these infrastructure requirements, thereby demonstrating the advantages of following the guidelines. The paper also highlight the ill effects of not adhering to the guidelines.
Keywords :
VLSI; automatic test pattern generation; built-in self test; design for testability; integrated circuit testing; logic testing; ATPG; DFT; debug time; debug tools; design tools; full scan debug; infrastructure requirements; memory debug features; pattern validation; production device; rapid first silicon debug; test pattern generation; test tools; Debugging; Design engineering; Guidelines; Instruments; Job shop scheduling; Process design; Production; Semiconductor device manufacture; Silicon; Testing;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041814