DocumentCode :
2378652
Title :
High Q resonating cantilevers for in situ measurements of ferromagnetic films
Author :
Moreland, John ; Hubbard, Ted J.
Author_Institution :
Magnetic Technol. Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fYear :
2001
fDate :
2001
Firstpage :
36
Lastpage :
39
Abstract :
We describe micro cantilevers developed for in-situ measurements of ultra-thin ferromagnetic films. The cantilevers are optimized for use in a resonating torque micro-balance magnetometer that measures the magnetic moment of thin films as they are being deposited on to the cantilever. Dynamic feedback is used to balance the magnetic torque by applying a mechanical force at the base of the cantilever that is equal and opposite to the magnetic torque. The dynamic feedback minimizes mass loading and temperature dependent elastic modulus effects that change the resonant frequency of the cantilever during deposition
Keywords :
Q-factor; feedback; ferromagnetic materials; magnetic moments; magnetic thin films; magnetic variables measurement; micromechanical resonators; microsensors; torque; Fe-Si; Si; cantilever resonant frequency; dynamic feedback; high Q resonating cantilevers; in situ measurements; magnetic moment; magnetic torque balancing; mass loading effects; mechanical force; micro cantilevers; optimized cantilevers; resonating torque micro-balance magnetometer; temperature dependent elastic modulus effects; ultra-thin ferromagnetic films; Force feedback; Magnetic films; Magnetic moments; Magnetic resonance; Magnetoelasticity; Magnetometers; Q measurement; Sputtering; Temperature dependence; Torque measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectromechanical Systems Conference, 2001
Conference_Location :
Berkeley, CA
Print_ISBN :
0-7803-7224-7
Type :
conf
DOI :
10.1109/MEMSC.2001.992737
Filename :
992737
Link To Document :
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