Title :
Mission possible? Open architecture ATE
Author :
Shahriari, Navid
Author_Institution :
Third Millennium Test Solutions
Abstract :
Summary form only given. The current ATE business model is on a path to making test unaffordable. There are several competing technologies, and no synergy between platforms. Adopting an open standard similar to the PC business model could offer significant advantage to both test equipment suppliers and users. ATE instrument solutions implemented in the VXI (VME extensions for instrumentation) and PXI (PCI extensions for instrumentation) are good examples of standards that support modularity and long-term capability scaling. This article discusses the technical feasibility and potential benefits of such an architecture.
Keywords :
automatic test equipment; open systems; peripheral interfaces; standards; ATE business model; ATE industry; PC business model; PCI extensions for instrumentation; PXI; VME extensions for instrumentation; VXI; competing test technologies; long-term capability scaling; modularity; open architecture ATE; open standard; technical feasibility; test costs; test equipment suppliers; test equipment users;
Conference_Titel :
Test Conference, 2002. Proceedings. International
Print_ISBN :
0-7803-7542-4
DOI :
10.1109/TEST.2002.1041913
